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revisions ltr description date (yr - mo - da) approved a make change to input offset voltage tests as specified under sections; ?v s = +5 v, v cm = 2.5 v? and ?v s = +3 v, v cm = 1.5 v? in table i. - ro 00- 11- 28 r. monnin b make change to supply current test as specified under section; ?v s = +3 v, v cm = 1.5 v? in table i. - ro 00- 12- 19 r. monnin c make change to v os delta limit as specified in table iib. - ro 01- 10- 05 r. monnin d add radiation hardened requirements. - ro 01- 11- 13 r. monnin e drawing updated to reflect current requirements. - rrp 06- 06- 27 r. monnin f update drawing as part of 5 year review. - jt 12- 01- 05 c. saffle g add device type 02. delete device class m references. - ro 13- 10- 22 c. saffle rev sheet rev sheet rev status rev g g g g g g g g g g g of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 pmic n/a prepared by rajesh pithadia dla land and maritime columbus, ohio 43218 - 3990 http://www.landandmaritime.dla.mil standard microcircuit drawing this drawing is available for use by all departments and agencies of the department of defense checked by rajesh pithadia approved by rajesh pithadia microcircuit, linear, quad, rail - to - rail, precision, operational amplifier, monolithic silicon drawing approval date 00- 04- 14 amsc n/a revision level g size a cage code 67268 5962- 00517 sheet 1 of 11 dscc form 2233 apr 97 5962- e 518- 13
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents two product assurance class levels consisting of high reliability (device class q) and space application (device class v). a choice of case outlines and lead finishes are available and are reflected in the part or identifying num ber (pin). when available, a choice of radiation hardness assurance (rha) levels is reflected in the pin. 1.2 pin . the pin is as shown in the following example: 5962 r 00517 01 v c a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) device class designator case outline (see 1.2.4) lead finish (see 1.2.5) \ / (see 1.2.3) \ / drawing number 1.2.1 rha designator . device classes q and v rha marked devices meet the mil - prf - 38535 specified rha levels and are marked with the appropriate rha designator. a dash ( - ) indicates a non- rha device. 1.2.2 device type(s) . the device type(s) identify the circuit function as follows: device type generic number circuit function 01 op484a precision, rail -to - rail input and output, quad operational amplifier 02 op484a precision, rail -to - rail input and output, quad operational amplifier 1.2.3 device class designator . the device class designator is a single letter identifying the product assurance level as follows: device class device requirements documentation q or v certification and qualification to mil - prf -38535 1.2.4 case outline(s) . the case outline(s) are as designated in mil - std - 1835 and as follows: outline letter descriptive designator terminals package style c gdip1 - t14 or cdip2- t14 14 dual -in - line d gdfp1 - f14 or cdfp2- f14 14 flat pack 1.2.5 lead finish . the lead finish is as specified in mil - prf - 38535 for device classes q and v.
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 3 dscc form 2234 apr 97 1.3 absolute maximum ratings . 1 / supply voltage ............................................................................................. 18 v power dissipation ........................................................................................ 500 mw differential input voltage .............................................................................. 0.6 v input voltage ................................................................................................ 18 v output short - circuit duration ........................................................................ indefinite storage temperature range ......................................................................... - 65c to +150c lead temperature (soldering, 60 seconds) .................................................. +300c junction temperature (t j ) ........................................................................... - 65c to +150c thermal resistance, junction -to - case ( mil - prf -38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil - std -883 - test method standard microcircuits. mil - std -1835 - interface stan dard electronic component case outlines. department of defense handbooks mil - hdbk -103 - list of standard microcircuit drawings. mil - hdbk -780 - standard microcircuit drawings. (copies of these documents are available online at http://quicksearch.dla.mil or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111 - 5094.) _____ 1 / stresses above the absolute maximum rating may cause permanent da mage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2 / device type 01 may be dose rate sensitive in space environment and may demonstrate enhanced low dose rate effects. radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in mil - std -883, method 1019, condition a. 3 / for device type 02, radiation end point limits for the noted parameters are guaranteed for the conditions specified in mil - std -88 3, method 1019, condition d.
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 4 dscc form 2234 apr 97 2.2 order of precedence . i n the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 item requirements . the individual item requirements for device classes q and v shall be in accordance with mil - prf - 38535 as specified herein, or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. 3.2 design, construction, and physical dimensions . the design, construction, and physical dimen sions shall be as specified in mil - prf - 38535 and herein for device classes q and v. 3.2.1 case outlines . the case outlines shall be in accordance with 1.2.4 herein. 3.2.2 terminal connections . the terminal connections shall be as specified on figure 1. 3.2. 3 radiation exposure circuit . the radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 electrical perfor mance characteristics and postirradiation parameter limits . unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table i and shall apply over the full ambient operating tem perature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii a . the electrical tests for each subgroup are defined in table i. 3.5 marking . the part shall be marked with the pin listed in 1.2 herein. in addition, the manufacturer's pin may also be marked. for packages where marking of the entire smd pin number is not feasible due to space limitations, the manufacturer has the option of no t marking the "5962 - " on the device. for rha product using this option, the rha designator shall still be marked. marking for device classes q and v shall be in accordance with mil - prf - 38535. 3.5.1 certification/compliance mark . the certification ma rk for device classes q and v shall be a "qml" or "q" as required in mil - prf - 38535. 3.6 certificate of compliance . for device classes q and v, a certificate of compliance shall be required from a qml - 38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). the certificate of compliance submitted to dla land and maritime - va prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes q and v, the requirements of mil - prf - 38535 and herein. 3.7 certificate of conformance . a certificate of conformance as required for device classes q and v in mil - prf - 38535 shall be provided with each lot of microcircuits delivered to this drawing.
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions 1 / 2 / -55 ? ? ?
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / 2 / -55
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 7 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / 2 / -55 ? ?
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 8 dscc form 2234 apr 97 device type s 01 , 02 case outlines c and d terminal number terminal symbol 1 output a 2 - inputa 3 +input a 4 +v s 5 +input b 6 - input b 7 output b 8 output c 9 - input c 10 +input c 11 -v s 12 +input d 13 - input d 14 output d figure 1. terminal connections .
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 9 dscc form 2234 apr 97 4. verification 4.1 sampling and inspection . for device classes q and v, sampling and inspection procedures shall be in accordance with mil - prf - 38535 or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or functi on as described herein. 4.2 screening . for device classes q and v, screening shall be in accordance with mil - prf - 38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2. 1 additional criteria for device classes q and v . a. the burn - in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in accordance with mil - prf - 38535. the burn- in test circuit shall be maintained under document revision level control of the device manufacturer's technology review board (trb) in accordance with mil - prf - 38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall speci fy the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of mil - std -883. b. interim and final electrical test parameters shall be as specified in table ii a herein. c. additional screenin g for device class v beyond the requirements of device class q shall be as specified in mil - prf - 38535, appendix b. 4.3 qualification inspection for device classes q and v . qualification inspection for device classes q and v shall be in accordance wit h mil - prf - 38535. inspections to be performed shall be those specified in mil- prf - 38535 and herein for groups a, b, c, d, and e inspections (see 4.4.1 through 4.4.4). 4.4 conformance inspection . technology conformance inspection for classes q and v sha ll be in accordance with mil - prf -38535 including groups a, b, c, d, and e inspections , and as specified herein. 4.4.1 group a inspection . a. tests shall be as specified in table ii a herein. b . subgroups 9, 10, and 11 in table i, method 5005 of mil - std - 883 shall be omitted. 4.4.2 group c inspection . the group c inspection end - point electrical parameters shall be as specified in table iia herein. 4.4.2.1 additional criteria for device classes q and v . the steady - state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in accordance with mil - prf - 38535. the test circuit shall be maintained under document revision level contro l by the device manufacturer's trb in accordance with mil - prf - 38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in acco rdance with the intent specified in method 1005 of mil - std -883. 4.4.3 group d inspection . the group d inspection end - point electrical parameters shall be as specified in table iia herein.
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 10 dscc form 2234 apr 97 table ii a. electrical test requirements . test requirements subgroups (in accordance with mil - prf - 38535, table iii) device class q device class v interim electrical parameters (see 4.2) 1 1 final electrical parameters (see 4.2) 1,2,3,4,5,6, 1 / 7,8 1,2,3,4, 1 / 2 / 5,6,7,8 group a test requirements (see 4.4) 1,2,3,4,5,6, 7,8 1,2,3,4,5,6, 7,8 group c end - point electrical parameters (see 4.4) 1 1 2 / group d end - point electrical parameters (see 4.4) 1 1 group e end - point electrical parameters (see 4.4) 1,4 1,4 1 / pda applies to subgroup 1. v os excluded from pda. 2 / delta limits as specified in table iib shall be required where specified, and delta limits shall be computed with reference to the previous endpoint electrical parameters. table iib. 240 hour burn - in and group c end - point electrical parameters . t a = 25
standard microcircuit drawing size a 5962- 00517 dla land and maritime columbus, ohio 43218 - 3990 revision level g sheet 11 dscc form 2234 apr 97 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil - prf - 38535 for device classes q and v. 6. notes 6.1 intended use . microcircuits conforming to this drawing are intended for use for government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 replaceability . microcircuits covered by this drawing will re place the same generic device covered by a contractor prepared specification or drawing. 6.2 configuration control of smd's . all proposed changes to existing smd's will be coordinated with the users of record for the individual documents. this coordin ation will be accomplished using dd form 1692, engineering change proposal. 6.3 record of users . military and industrial users should inform dla land and maritime when a system application requires configuration control and which smd's are applicable to that system. dla land and maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. users of drawings covering microelectronic devices (fsc 5962) should contact dla land and maritime - va, telephone (614) 692 - 8108 . 6.4 comments . comments on this drawing should be directed to dla land and maritime - va, columbus, ohio 4321 8 - 3990 , or telephone (614) 692 - 054 0 . 6.5 abbreviations, symbols, and definitions . the abbreviations, symbols, and definitions used herein are defined in mil - prf - 38535 and mil- hdbk -1331. 6.6 sources of supply . 6.6.1 sources of supply for device classes q and v . sour ces of supply for device classes q and v are listed in mil - hdbk -103 and qml - 38535. the vendors listed in mil - hdbk - 103 and qml - 38535 have submitted a certificate of compliance (see 3.6 herein) to dla land and maritime - va and have agreed to this drawing.
standard microcircuit drawing bulletin date: 13-10-22 approved sources of supply for smd 5962 -00517 are listed below for immediate acquisition information only and shall be added to mil - hdbk - 103 and qml- 38535 during the next revision. mil - hdbk - 103 and qml- 38535 will be revised to include the addition or deletion of sources. the vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by dla land and maritime - va. th is information bulletin is superseded by the next dated revision of mil - hdbk - 103 and qml-38535. dla land and maritime maintains an online database of all current sources of supply at http:/ /www.landandmaritime.dla.mil/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962- 0051701vca 24355 op484ay/qmlv 5962- 0051701vda 24355 op484am/qmlv 5962r0051701vca 24355 op484ay/qmlr 5962R0051701VDA 24355 op484am/qmlr 5962l0051702vda 24355 op484am/qmll 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. vendor cage vendor name number and address 24355 analog devices rt 1 industrial park p.o. box 9106 norwood, ma 02062 point of contact: 7910 triad center drive greensboro, nc 27409- 9605 the information contained herein is disseminated for convenience only and the government assumes no liability whatsoever for any inaccuracies in the information bulletin.

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